By Joe Kelly
That includes important enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its type source deals skilled engineers a entire figuring out of the complicated themes in RF, SiP (system-in-package), and SoC (system-on-a-chip) construction trying out which are severe to their paintings regarding semiconductor units. The booklet covers key dimension thoughts for semiconductor machine trying out and assists engineers in explaining those suggestions to administration to help reduce undertaking expense, time, and assets. according to real-world event and choked with time-saving equations, this in-depth quantity deals pros sensible details on crucial issues that experience by no means been provided in one reference earlier than.
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Extra info for Advanced Production Testing of RF, SoC, and SiP Devices
13) where ∆f is the change in frequency and ∆V is the change in voltage applied to the VCO. As an example, assume that a VCO operates between 850 and 900 MHz. 1. 8 MHz/V. 8 MHz for every 1-V change at its input. 3 PLL Settling Time The PLL settling time is the time that it takes the PLL to change from one frequency to another. Obviously this is a very important parameter for standards 1. Some modern SoC devices have VCOs that are designed with tunable capacitors in order to cover a wider frequency band.
Asp, 1996. 1 S-Parameters One of the most frequently used methods to describe the functionality of RF devices is to use scattering parameters, or in short S-parameters. S-parameters are used to describe how a device alters voltage waves that are applied to its ports. For instance, an amplifier should increase the amplitude of the voltage wave that was applied to the input of the device. Therefore, the S-parameter measurement of an amplifier’s gain compares the output amplitude of the amplifier to the amplitude of the voltage wave that was applied to stimulate the amplifier.
Other standard specific tests that require modulated signals are ACLR [commonly performed for code division multiple access (CDMA) devices], bit error rate tests (commonly performed on Bluetooth devices), or error vector magnitude (EVM), which is frequently measured on devices that use orthogonal frequency division modulation (OFDM) such as Worldwide Interoperability for Microwave Access (WiMAX). A device-specific test is a test that is not performed because it is required according to the IEEE specification, but performed by the vendor to guarantee correct design of the device.