By Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
The luck of the Springer sequence utilized Scanning Probe equipment I–VII and the speedily increasing actions in scanning probe improvement and purposes world wide made it a common step to assemble additional speci c leads to the elds of improvement of scanning probe microscopy strategies (Vol. VIII), characterization (Vol. IX), and biomimetics and commercial purposes (Vol. X). those 3 volumes supplement the former set of volumes lower than the topic themes and provides perception into the hot paintings of prime experts of their respective elds. Following the culture of the sequence, the chapters are prepared round strategies, characterization and biomimetics and commercial functions. quantity VIII specializes in novel scanning probe strategies and the certainty of tip/sample interactions. themes comprise close to eld imaging, complicated AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever platforms, mixtures of AFM sensors and scanning electron and ion microscopes, calibration equipment, frequency modulation AFM for program in beverages, Kelvin probe strength microscopy, scanning capacitance microscopy, and the dimension of electric delivery homes on the nanometer scale. Vol. IX makes a speciality of characterization of fabric surfaces together with structural in addition to neighborhood mechanical characterization, and molecular structures. the amount covers a huge spectrum of STM/AFM investigations together with fullerene layers, strength spectroscopy for probing fabric houses in most cases, organic lms .and cells, epithelial and endothelial layers, clinical similar structures equivalent to amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical houses ofpolymernanostructures, technical polymers, and close to eld optics.
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Additional info for Applied scanning probe methods X: biomimetics and industrial applications
469 14 15 16 Contents – Volume II 1 2 3 4 5 Higher Harmonics in Dynamic Atomic Force Microscopy Robert W. Stark, Martin Stark . . . . . . . . . . 1 Atomic Force Acoustic Microscopy Ute Rabe . . . . . . . . . . . . . . . . 37 Scanning Ion Conductance Microscopy Tilman E. Schäffer, Boris Anczykowski, Harald Fuchs . . . . 91 Spin-Polarized Scanning Tunneling Microscopy Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner . . . . .
241 Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices Paul Girard, Alexander Nikolaevitch Titkov . . . . . . . 283 8 9 10 Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures Pietro Giuseppe Gucciardi, Ruggero Micheletto, Yoichi Kawakami, Maria Allegrini . . . . . . . . . . . . . . . 321 XXXIV 11 Contents – Volume II Focused Ion Beam as a Scanning Probe: Methods and Applications Vittoria Raffa, Piero Castrataro, Arianna Menciassi, Paolo Dario .
389 Super Density Optical Data Storage by Near-Field Optics Jun Tominaga . . . . . . . . . . . . . . . 429 Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM) Ryoichi Yamamoto . . . . . . . . . . . . . . 439 Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Process Kazuhiko Matsumoto . . . . . . . . . . . . . 459 Subject Index . . . . . . . . . . .